About the Journal

  1. Journal Title : Journal of Future Artificial Intelligence and Technologies
  2. Initials : FAITH
  3. Abbreviation : J. Fut. Artif. Intell. Tech.
  4. Frequency : Quarterly (March, June, September, December) 
  5. Online ISSN : 3048-3719
  6. Editor in Chief : Assoc. Prof. Dr. De Rosal Ignatius Moses Setiadi
  7. DOI Prefix: 10.62411/faith
  8. Publisher : Future Techno Science

Journal of Future Artificial Intelligence and Technologies E-ISSN: 3048-3719 is an international journal that delves into the comprehensive spectrum of artificial intelligence, focusing on its foundations, advanced theories, and applications. FREE OF CHARGES for submission and publication. All accepted articles will be published online, receive a DOI from CROSSREF, and will be OPEN ACCESS. The RAPID peer-reviewed process is designed to provide the first decision within approximately two weeks. The journal publishes papers in areas including, but not limited to:

  • Machine Learning,
  • Deep Learning,
  • Computer Vision,
  • Natural Language Processing,
  • Reinforcement Learning,
  • Quantum Computing in AI,
  • AI in Image Processing,
  • AI in Security,
  • AI in Signal Processing, and
  • Various other AI Applications

Special emphasis is given to recent trends related to cutting-edge research within the domain.

If you want to become an author(s) in this journal, you can start by accessing the About page. You can first read the Policies section to find out the policies determined by the FAITH. Then, if you submit an article, you can see the guidelines in the Author Guidelines section. Each journal submission will be made online and requires prospective authors to register and have an account to be able to submit manuscripts.

Indexed by:

https://www.scilit.net/sources/483503

Current Issue

Vol. 2 No. 1 (2025): in progress
View Vol. 2 No. 1 (2025): in progress

Authors' Diversity: The authors come from a diverse range of countries, including Indonesia, India, and Malaysia.

Published: 2025-06-30

Articles

View All Issues